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Other articles related with "scanning transmission electron microscopy"：
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38502 |
Zhetong Liu(刘哲彤), Bingyao Liu(刘秉尧), Dongdong Liang(梁冬冬), Xiaomei Li(李晓梅), Xiaomin Li(李晓敏), Li Chen(陈莉), Rui Zhu(朱瑞), Jun Xu(徐军), Tongbo Wei(魏同波), Xuedong Bai(白雪冬), and Peng Gao(高鹏) |
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Nanoscale cathodoluminescence spectroscopy probing the nitride quantum wells in an electron microscope |
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Chin. Phys. B
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37801 |
Shu-Fang Ma(马淑芳), Lei Li(李磊), Qing-Bo Kong(孔庆波), Yang Xu(徐阳), Qing-Ming Liu(刘青明), Shuai Zhang(张帅), Xi-Shu Zhang(张西数), Bin Han(韩斌), Bo-Cang Qiu(仇伯仓), Bing-She Xu(许并社), and Xiao-Dong Hao(郝晓东) |
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Atomic-scale insights of indium segregation and its suppression by GaAs insertion layer in InGaAs/AlGaAs multiple quantum wells |
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Chin. Phys. B
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66107 |
Yu-Xin Tong(仝毓昕), Qing-Hua Zhang(张庆华), Lin Gu(谷林) |
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Scanning transmission electron microscopy: A review of high angle annular dark field and annular bright field imaging and applications in lithium-ion batteries |
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Chin. Phys. B
2018 Vol.27 (6): 66107-066107
[Abstract]
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